Nanoscale Imaging and Measuring Laboratory
Supervisor
Eisaku OHO: Professor
The scanning electron microscope (SEM) is widely accepted and utilized in various fields. However, it cannot demonstrate its real ability frequently, owing to difficulty of auto-tuning and the effects of radiation damage, charging problem, etc. To settle those challenging problems, we are mainly studying on image acquisition and processing technologies. The results of our study will be actively applied in the near future in order to improve the performance and usability of the advanced SEM system.
Topics of research |
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keyword | Advanced Scanning Electron Microscopy / Image Processing Technology / Auto-tuning of a Scanning Electron Microscope |